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Extended defects in semiconductors : electronic properties, device effects and structures /
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Printed Book |
| Language: | English |
| Published: |
Cambridge ; New York :
Cambridge University Press,
2007.
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| Subjects: | |
| Online Access: | Table of contents only Publisher description Contributor biographical information |
| LEADER | 01459cam a2200289 a 4500 | ||
|---|---|---|---|
| 008 | 061108s2007 enka b 001 0 eng | ||
| 999 | |c 300671 |d 300671 | ||
| 010 | |a 2006037298 | ||
| 020 | |a 9780521819343 (hbk.) | ||
| 020 | |a 0521819342 (hbk.) | ||
| 035 | |a (OCoLC)ocm76167306 | ||
| 035 | |a (OCoLC)76167306 | ||
| 082 | 0 | 0 | |a 621.38152 |2 22 |
| 100 | 1 | |a Holt, D. B. | |
| 245 | 1 | 0 | |a Extended defects in semiconductors : |b electronic properties, device effects and structures / |c D.B. Holt, B.G. Yacobi. |
| 260 | |a Cambridge ; |a New York : |b Cambridge University Press, |c 2007. | ||
| 300 | |a xi, 631 p. : |b ill. ; |c 26 cm. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 650 | 0 | |a Semiconductors |x Defects. | |
| 700 | 1 | |a Yacobi, B. G. | |
| 856 | 4 | 1 | |3 Table of contents only |u http://www.loc.gov/catdir/toc/ecip074/2006037298.html |
| 856 | 4 | 2 | |3 Publisher description |u http://www.loc.gov/catdir/enhancements/fy0703/2006037298-d.html |
| 856 | 4 | 2 | |3 Contributor biographical information |u http://www.loc.gov/catdir/enhancements/fy0803/2006037298-b.html |
| 942 | |c BK | ||
| 906 | |a 7 |b cbc |c orignew |d 1 |e ecip |f 20 |g y-gencatlg | ||
| 955 | |a jf07 2006-11-08 |c jf07 2006-11-08 |a aa20 2006-11-13 |a ps08 2007-06-19 1 copy rec'd., to CIP ver. |a lk53 2007-07-06 copy 2 added | ||
| 952 | |0 0 |1 0 |2 ddc |4 0 |6 621_381520000000000_HOL_E |7 0 |9 343596 |a NAN |b NAN |c ST1 |d 2019-01-11 |e The book shop,Publication division |g 8159.20 |i 382 |l 0 |o 621.38152 HOL/E |p NAN382 |r 2019-01-11 |v 11656.00 |y BK |k P124 | ||