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Reliability and radiation effects in compound semiconductors /
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| Format: | Printed Book |
| Published: |
Hackensack, NJ. ; London :
World Scientific,
c2010.
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| Subjects: |
| Physical Description: | xii, 363 p. : ill. ; |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9789814277105 981427710X |