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Electrical conduction and dielectrical behavior of thin films of vaccum evaporated amorphus silicon, Hydrogenate amorphus silicon and chemically deposite cadmium sheets

Bibliographic Details
Main Author: Rajeev Kumar K.
Format: Ph.D Thesis
Language:English
Published: Kochi Dept. of Physics - CUSAT 1989
Subjects:

UL

Holdings details from UL
Call Number: 539.216:537.311:546.28 RAJ
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