Fault-tolerance and reliability techniques for high-density random-access memories

other_versions_link
Bibliographic Details
Main Author: Chakraborty, Kanad
Other Authors: Mazumder, Pinaki
Format: Printed Book
Language:English
Published: New Delhi Pearson Education 2002
Subjects:
RAM- fault tolerance > Computer memory > Computer science

UL

Holdings details from UL
Call Number: 004.332.3 CHA
Copy Live Status Unavailable

Similar Items