Defects in microelectronic materials and devices

Bibliographic Details
Main Author: Fleetwood, Daniel M. (ed.by)
Other Authors: Pantelides,Sokrates T. Schrimpf,Ronald D.
Format: Printed Book
Language:English
Published: London CRC 2009
Subjects:
Microelectronics-materials-testing > Metal oxide semiconductor field effect transistors-testing > Integrated circuits-defects

UL

Holdings details from UL
Call Number: 621.3.049.77 FLE
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